test-bench-pd200/index.org

Voltage Amplifier PD200 - Test Bench

• Introduction
• Voltage Amplifier Requirements
• PD200 Expected characteristics
• Voltage Amplifier Model
• Noise measurement
  • Setup
  • Results
• Transfer Function measurement
  • Setup
  • Results
• Conclusion

Introduction

The goal of this test bench is to characterize the Voltage amplifier PD200 from PiezoDrive.

The documentation of the PD200 is accessible here.

Voltage Amplifier Requirements

	Specification
Continuous Current	> 50 [mA]
Output Voltage Noise (1-200Hz)	< 2 [mV rms]
Voltage Input Range	+/- 10 [V]
Voltage Output Range	-20 [V] to 150 [V]
Small signal bandwidth (-3dB)	> 5 [kHz]

PD200 Expected characteristics

Characteristics	Manual	Specification
Input Voltage Range	+/- 10 [V]	+/- 10 [V]
Output Voltage Range	-50/150 [V]	-20/150 [V]
Gain	20 [V/V]
Maximum RMS current	0.9 [A]	> 50 [mA]
Maximum Pulse current	10 [A]
Slew Rate	150 [V/us]
Noise (10uF load)	0.7 [mV RMS]	< 2 [mV rms]
Small Signal Bandwidth (10uF load)	7.4 [kHz]	> 5 [kHz]
Large Signal Bandwidth (150V, 10uF)	300 [Hz]

For a load capacitance of $10\,\mu F$, the expected $-3\,dB$ bandwidth is $6.4\,kHz$ (Figure fig:pd200_expected_small_signal_bandwidth) and the low frequency noise is $650\,\mu V\,\text{rms}$ (Figure fig:pd200_expected_noise).

#+caption:Expected small signal bandwidth

Voltage Amplifier Model

The Amplifier is characterized by its dynamics $G_a(s)$ from voltage inputs $V_{in}$ to voltage output $V_{out}$. Ideally, the gain from $V_{in}$ to $V_{out}$ is constant over a wide frequency band with very small phase drop.

It is also characterized by its output noise $n$. This noise is described by its Power Spectral Density.

The objective is therefore to determine the transfer function $G_a(s)$ from the input voltage to the output voltage as well as the Power Spectral Density $S_n(\omega)$ of the amplifier output noise.

As both $G_a$ and $S_n$ depends on the load capacitance, they should be measured when loading the amplifier with a $\SI{10}{\micro\farad}$ capacitor.

  \begin{tikzpicture}
    \node[block] (G) at (0,0){$G_a(s)$};
    \node[addb, right=0.8 of G] (add){};

    \draw[<-] (G.west) -- ++(-1.2, 0) node[above right]{$V_{in}$};
    \draw[->] (G.east) -- (add.west);
    \draw[->] (add.east) -- ++(1.2, 0) node[above left]{$V_{out}$};
    \draw[<-] (add.north) -- ++(0, 0.6) node[below right](n){$n$};

    \begin{scope}[on background layer]
      \node[fit={(G.south west) (n.north-|add.east)}, inner sep=8pt, draw, dashed, fill=black!20!white] (P) {};
      \node[below] at (P.north) {PD-200};
    \end{scope}
  \end{tikzpicture}

Model of the voltage amplifier

Noise measurement

Setup

Here are the documentation of the equipment used for this test bench:

• Voltage Amplifier PD200
• Load Capacitor EPCOS 10uF Multilayer Ceramic Capacitor
• Low Noise Voltage Amplifier EG&G 5113
• Speedgoat ADC IO313

The output noise of the voltage amplifier PD200 is foreseen to be around 1mV rms in a bandwidth from DC to 1MHz. If we suppose a white noise, this correspond to an amplitude spectral density:

\begin{equation} \phi_{n} \approx \frac{1\,mV}{\sqrt{1\,MHz}} = 1 \frac{\mu V}{\sqrt{Hz}} \end{equation}

The RMS noise begin very small compare to the ADC resolution, we must amplify the noise before digitizing the signal. The added noise of the instrumentation amplifier should be much smaller than the noise of the PD200. We use the amplifier EG&G 5113 that has a noise of $\approx 4 nV/\sqrt{Hz}$ referred to its input which is much smaller than the noise induced by the PD200.

The gain of the low-noise amplifier can be increased until the full range of the ADC is used. This gain should be around 1000.

A low pass filter at 10kHz can be included in the EG&G amplifier in order to limit aliasing. An high pass filter at low frequency can be added if there is a problem of large offset.

Results

Transfer Function measurement

Setup

In order to measure the transfer function from the input voltage $V_{in}$ to the output voltage $V_{out}$, the test bench shown in Figure fig:setup-dynamics-measurement is used.

Here are the documentation of the equipment used for this test bench:

• Voltage Amplifier PD200
• Load Capacitor EPCOS 10uF Multilayer Ceramic Capacitor
• Speedgoat DAC/ADC IO313

For this measurement, the sampling frequency of the Speedgoat ADC should be as high as possible.

Schematic of the test bench to estimate the dynamics from voltage input $V_{in}$ to voltage output $V_{out}$

Results

Conclusion

Characteristics	Measurement	Manual	Specification
Input Voltage Range	-	+/- 10 [V]	+/- 10 [V]
Output Voltage Range	-	-50/150 [V]	-20/150 [V]
Gain		20 [V/V]	-
Maximum RMS current		0.9 [A]	> 50 [mA]
Maximum Pulse current		10 [A]	-
Slew Rate		150 [V/us]	-
Noise (10uF load)		0.7 [mV RMS]	< 2 [mV rms]
Small Signal Bandwidth (10uF load)		7.4 [kHz]	> 5 [kHz]
Large Signal Bandwidth (150V, 10uF)		300 [Hz]	-