digital-brain/content/book/fleming14_desig_model_contr_nanop_system.md

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+++ title = "Design, modeling and control of nanopositioning systems" author = ["Dehaeze Thomas"] description = "Talks about various topics related to nano-positioning systems." keywords = ["Control", "Metrology", "Flexible Joints"] draft = false +++

Tags
[Piezoelectric Actuators]({{< relref "piezoelectric_actuators.md" >}}), [Flexible Joints]({{< relref "flexible_joints.md" >}})
Reference
(Fleming and Leang 2014)
Author(s)
Fleming, A. J., & Leang, K. K.
Year
2014

Introduction to Nanotechnology

Introduction to Nanopositioning

Scanning Probe Microscopy

Challenges with Nanopositioning Systems

Hysteresis

Creep

Thermal Drift

Mechanical Resonance

Control of Nanopositioning Systems

Feedback Control

Feedforward Control

Book Summary

Assumed Knowledge

Content Summary

References

The Piezoelectric Effect

Piezoelectric Compositions

Manufacturing Piezoelectric Ceramics

Piezoelectric Transducers

Application Considerations

Response of Piezoelectric Actuators

Modeling Creep and Vibration in Piezoelectric Actuators

Chapter Summary

References

Piezoelectric Tube Nanopositioners

63mm Piezoelectric Tube

40mm Piezoelectric Tube Nanopositioner

Piezoelectric Stack Nanopositioners

Phyisk Instrumente P-734 Nanopositioner

Phyisk Instrumente P-733.3DD Nanopositioner

Vertical Nanopositioners

Rotational Nanopositioners

Low Temperature and UHV Nanopositioners

Tilting Nanopositioners

Optical Objective Nanopositioners

References

Introduction

Operating Environment

Methods for Actuation

Flexure Hinges

Introduction

Types of Flexures

Flexure Hinge Compliance Equations

Stiff Out-of-Plane Flexure Designs

Failure Considerations

Finite Element Approach for Flexure Design

Material Considerations

Materials for Flexure and Platform Design

Thermal Stability of Materials

Manufacturing Techniques

Design Example: A High-Speed Serial-Kinematic Nanopositioner

State-of-the-Art Designs

Tradeoffs and Limitations in Speed

Serial- Versus Parallel-Kinematic Configurations

Piezoactuator Considerations

Preloading Piezo-Stack Actuators

Flexure Design for Lateral Positioning

Design of Vertical Stage

Fabrication and Assembly

Drive Electronics

****0 Experimental Results

Chapter Summary

References

Introduction

Sensor Characteristics

Calibration and Nonlinearity

Drift and Stability

Bandwidth

Noise

Resolution

Combining Errors

Metrological Traceability

Nanometer Position Sensors

Resistive Strain Sensors

Piezoresistive Strain Sensors

Piezoelectric Strain Sensors

Capacitive Sensors

MEMs Capacitive and Thermal Sensors

Eddy-Current Sensors

Linear Variable Displacement Transformers

Laser Interferometers

Linear Encoders

Comparison and Summary

Outlook and Future Requirements

References

Introduction

Shunt Circuit Modeling

Open-Loop

Shunt Damping

Implementation

Experimental Results

Tube Dynamics

Amplifier Performance

Shunt Damping Performance

Chapter Summary

References

Introduction

Experimental Setup

PI Control

PI Control with Notch Filters

PI Control with IRC Damping

Performance Comparison

Noise and Resolution

Analog Implementation

Application to AFM Imaging

References

Introduction

Modeling

Actuator Dynamics

Sensor Dynamics

Sensor Noise

Mechanical Dynamics

System Properties

Example System

Damping Control

Tracking Control

Relationship Between Force and Displacement

Integral Displacement Feedback

Direct Tracking Control

Dual Sensor Feedback

Low Frequency Bypass

Feedforward Inputs

Higher-Order Modes

Experimental Results

Experimental Nanopositioner

Actuators and Force Sensors

Control Design

Noise Performance

Chapter Summary

References

Why Feedforward?

Modeling for Feedforward Control

Feedforward Control of Dynamics and Hysteresis

Simple DC-Gain Feedforward Control

An Inversion-Based Feedforward Approach for Linear Dynamics

Frequency-Weighted Inversion: The Optimal Inverse

Application to AFM Imaging

Feedforward and Feedback Control

Application to AFM Imaging

Iterative Feedforward Control

The ILC Problem

Model-Based ILC

Nonlinear ILC

Conclusions

References

10.1 Introduction

10.1.1 Background

10.1.2 The Optimal Periodic Input

10.2 Signal Optimization

10.3 Frequency Domain Cost Functions

10.3.1 Background: Discrete Fourier Series

10.3.2 Minimizing Signal Power

10.3.3 Minimizing Frequency Weighted Power

10.3.4 Minimizing Velocity and Acceleration

10.3.5 Single-Sided Frequency Domain Calculations

10.4 Time Domain Cost Function

10.4.1 Minimum Velocity

10.4.2 Minimum Acceleration

10.4.3 Frequency Weighted Objectives

10.5 Application to Scan Generation

10.5.1 Choosing β and K

10.5.2 Improving Feedback and Feedforward Controllers

10.6 Comparison to Other Techniques

10.7 Experimental Application

10.8 Chapter Summary

References

11.1 Introduction

11.2 Modeling Hysteresis

11.2.1 Simple Polynomial Model

11.2.2 Maxwell Slip Model

11.2.3 Duhem Model

11.2.4 Preisach Model

11.2.5 Classical Prandlt-Ishlinksii Model

11.3 Feedforward Hysteresis Compensation

11.3.1 Feedforward Control Using the Presiach Model

11.3.2 Feedforward Control Using the Prandlt-Ishlinksii Model

11.4 Chapter Summary

References

12.1 Introduction

12.2 Charge Drives

12.3 Application to Piezoelectric Stack Nanopositioners

12.4 Application to Piezoelectric Tube Nanopositioners

12.5 Alternative Electrode Configurations

12.5.1 Grounded Internal Electrode

12.5.2 Quartered Internal Electrode

12.6 Charge Versus Voltage

12.6.1 Advantages

12.6.2 Disadvantages

12.7 Impact on Closed-Loop Control

12.8 Chapter Summary

References

13.1 Introduction

13.2 Review of Random Processes

13.2.1 Probability Distributions

13.2.2 Expected Value, Moments, Variance, and RMS

13.2.3 Gaussian Random Variables

13.2.4 Continuous Random Processes

13.2.5 Joint Density Functions and Stationarity

13.2.6 Correlation Functions

13.2.7 Gaussian Random Processes

13.2.8 Power Spectral Density

13.2.9 Filtered Random Processes

13.2.10 White Noise

13.2.11 Spectral Density in V/sqrtHz

13.2.12 Single- and Double-Sided Spectra

13.3 Resolution and Noise

13.4 Sources of Nanopositioning Noise

13.4.1 Sensor Noise

13.4.2 External Noise

13.4.3 Amplifier Noise

13.5 Closed-Loop Position Noise

13.5.1 Noise Sensitivity Functions

13.5.2 Closed-Loop Position Noise Spectral Density

13.5.3 Closed-Loop Noise Approximations with Integral Control

13.5.4 Closed-Loop Position Noise Variance

13.5.5 A Note on Units

13.6 Simulation Examples

13.6.1 Integral Controller Noise Simulation

13.6.2 Noise Simulation with Inverse Model Controller

13.6.3 Feedback Versus Feedforward Control

13.7 Practical Frequency Domain Noise Measurements

13.7.1 Preamplification

13.7.2 Spectrum Estimation

13.7.3 Direct Measurement of Position Noise

13.7.4 Measurement of the External Disturbance

13.8 Experimental Demonstration

13.9 Time-Domain Noise Measurements

13.9.1 Total Integrated Noise

13.9.2 Estimating the Position Noise

13.9.3 Practical Considerations

13.9.4 Experimental Demonstration

13.10 A Simple Method for Measuring the Resolution of Nanopositioning Systems

13.11 Techniques for Improving Resolution

13.12 Chapter Summary

References

Electrical Considerations

Amplifier and Piezo electrical models

{{< figure src="/ox-hugo/fleming14_amplifier_model.png" caption="<span class="figure-number">Figure 1: A voltage source \(V_s\) driving a piezoelectric load. The actuator is modeled by a capacitance \(C_p\) and strain-dependent voltage source \(V_p\). The resistance \(R_s\) is the output impedance and \(L\) the cable inductance." >}}

Consider the electrical circuit shown in Figure 1 where a voltage source is connected to a piezoelectric actuator. The actuator is modeled as a capacitance \(C_p\) in series with a strain-dependent voltage source \(V_p\). The resistance \(R_s\) and inductance \(L\) are the source impedance and the cable inductance respectively.

Typical inductance of standard RG-58 coaxial cable is \(250 nH/m\). Typical value of \(R_s\) is between \(10\) and \(100 \Omega\).

When considering the effects of both output impedance and cable inductance, the transfer function from source voltage \(V_s\) to load voltage \(V_L\) is second-order low pass filter:

\begin{equation} \frac{V_L(s)}{V_s(s)} = \frac{1}{\frac{s^2}{\omega_r^2} + 2 \xi \frac{s}{\omega_r} + 1} \end{equation}

with:

  • \(\omega_r = \frac{1}{\sqrt{L C_p}}\)
  • \(\xi = \frac{R_s \sqrt{L C_p}}{2 L}\)

Amplifier small-signal Bandwidth

The most obvious bandwidth limitation is the small-signal bandwidth of the amplifier.

If the inductance \(L\) is neglected, the transfer function from source voltage \(V_s\) to load voltage \(V_L\) forms a first order filter with a cut-off frequency

\begin{equation} \omega_c = \frac{1}{R_s C_p} \end{equation}

This is thus highly dependent of the load.

The high capacitive impedance nature of piezoelectric loads introduces phase-lag into the feedback path. A rule of thumb is that closed-loop bandwidth cannot exceed one-tenth the cut-off frequency of the pole formed by the amplifier output impedance \(R_s\) and load capacitance \(C_p\) (see Table 1 for values).

Table 1: Bandwidth limitation due to \(R_s\)
Cp = 100 nF Cp = 1 uF Cp = 10 uF
Rs = 1 Ohm 1.6 MHz 160 kHz 16 kHz
Rs = 10 Ohm 160 kHz 16 kHz 1.6 kHz
Rs = 100 Ohm 16 kHz 1.6 kHz 160 Hz

The inductance \(L\) does also play a role in the amplifier bandwidth as it changes the resonance frequency. Ideally, low inductance cables should be used. It is however usually quite high compare to \(\omega_c\) as shown in Table 2.

Table 2: Bandwidth limitation due to \(R_s\)
Cp = 100 nF Cp = 1 uF Cp = 10 uF
L = 25 nH 3.2 MHz 1 MHz 320 kHz
L = 250 nH 1 MHz 320 kHz 100 kHz
L = 2500 nH 320 kHz 100 kHz 32 kHz

Amplifier maximum slew rate

Further bandwidth restrictions are imposed by the maximum slew rate of the amplifier. This is the maximum rate at which the output voltage can change and is usually expressed in \(V/\mu s\).

For sinusoidal signals, the amplifiers slew rate must exceed: \[ SR_{\text{sin}} > V_{p-p} \pi f \] where \(V_{p-p}\) is the peak to peak voltage and \(f\) is the frequency.

If a 300kHz sine wave is to be reproduced with an amplitude of 10V, the required slew rate is \(\approx 20 V/\mu s\).

When dealing with capacitive loads, the current limit is usually exceed well before the slew rate limit.

Current and Power Limitations

When driving the actuator off-resonance, the current delivered to a piezoelectric actuator is approximately: \[ I_L(s) = V_L(s) C_p s \]

For sinusoidal signals, the maximum positive and negative current is equal to: \[ I_L^\text{max} = V_{p-p} \pi f C_p \]

Table 3: Minimum current requirements for a 10V sinusoid
Cp = 100 nF Cp = 1 uF Cp = 10 uF
f = 30 Hz 0.19 mA 1.9 mA 19 mA
f = 3 kHz 19 mA 190 mA 1.9 A
f = 300 kHz 1.9 A 19 A 190 A

Chapter Summary

The bandwidth limitations of standard piezoelectric drives were identified as:

  • High output impedance
  • The presence of a ple in the voltage-feedback loop due to output impedance and load capacitance
  • Insufficient current capacity due to power dissipation
  • High cable and connector inductance

References

Bibliography

Fleming, Andrew J., and Kam K. Leang. 2014. Design, Modeling and Control of Nanopositioning Systems. Advances in Industrial Control. Springer International Publishing. doi:10.1007/978-3-319-06617-2.