digital-brain/content/article/fleming10_nanop_system_with_force_feedb.md
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+++ title = "Nanopositioning system with force feedback for high-performance tracking and vibration control" author = ["Thomas Dehaeze"] draft = false +++

Tags
[Sensor Fusion]({{< relref "sensor_fusion" >}}), [Force Sensors]({{< relref "force_sensors" >}})
Reference
(Fleming, 2010)
Author(s)
Fleming, A.
Year
2010

Summary:

  • The noise generated by a piezoelectric force sensor is much less than a capacitive sensor
  • Dynamical model of a piezoelectric stack actuator and piezoelectric force sensor
  • Noise of a piezoelectric force sensor
  • IFF with a piezoelectric stack actuator and piezoelectric force sensor
  • A force sensor is used as a displacement sensor below the frequency of the first zero
  • Sensor fusion architecture with a capacitive sensor and a force sensor and using complementary filters
  • Virtual sensor fusion architecture (called low-frequency bypass)
  • Analog implementation of the control strategies to avoid quantization noise, finite resolution and sampling delay

Model of a multi-layer monolithic piezoelectric stack actuator

{{< figure src="/ox-hugo/fleming10_piezo_model.png" caption="Figure 1: Schematic of a multi-layer monolithic piezoelectric stack actuator model" >}}

The actuator experiences an internal stress in response to an applied voltage. This stress is represented by the voltage dependent force \(F_a\) and is related to free displacement by \[ \Delta L = \frac{F_a}{k_a} \]

  • \(\Delta L\) is the change in actuator length in [m]
  • \(k_a\) is the actuator stiffness in [N/m]

The developed force \(F_a\) is related to the applied voltage by: \[ \Delta L = d_{33} n V_a \]

  • \(d_{33}\) is the piezoelectric strain constant in [m/V]
  • \(n\) is the number of layers
  • \(V_a\) is the applied voltage in [V]

Combining the two equations, we obtain: \[ F_a = d_{33} n k_a V_a \]

The ratio of the developed force to applied voltage is \(d_{33} n k_a\) in [N/V]. We denote this constant by \(g_a\) and: \[ F_a = g_a V_a, \quad g_a = d_{33} n k_a \]

Dynamics of a piezoelectric force sensor

Piezoelectric force sensors provide a high sensitivity and bandwidth with low noise at high frequencies.

If a single wafer of piezoelectric material is sandwiched between the actuator and platform: \[ D = d_{33} T \]

  • \(D\) is the amount of generated charge per unit area in \([C/m^2]\)
  • \(T\) is the stress in \([N/m^2]\)
  • \(d_{33}\) is the piezoelectric strain constant in \([m/V] = [C/N]\)

The generated charge is then \[ q = d_{33} F_s \]

If an n-layer piezoelectric transducer is used as a force sensor, the generated charge is then: \[ q = n d_{33} F_s \]


We can use a charge amplifier to measure the force \(F_s\).

{{< figure src="/ox-hugo/fleming10_charge_ampl_piezo.png" caption="Figure 2: Electrical model of a piezoelectric force sensor is shown in gray. Developed charge \(q\) is proportional to the strain and hence the force experienced by the sensor. Op-amp charge amplifier produces an output voltage \(V_s\) equal to \(-q/C_s\)" >}}

The output voltage \(V_s\) is equal to \[ V_s = -\frac{q}{C_s} = -\frac{n d_{33}F_s}{C_s} \] that is, the scaling between the force and voltage is \(-\frac{n d_{33}F_s}{C_s}\ [V/N]\) .


We can also use a voltage amplifier. In that case, the generated charge is deposited on the transducer's internal capacitance.

The open-circuit voltage of a piezoelectric force sensor is: \[ V_s = \frac{n d_{33} F_s}{C} \]

  • \(C\) is the transducer capacitance defined by \(C = n \epsilon_T A / h\) in [F]
    • \(A\) is the area in \([m^2]\)
    • \(h\) is the layer thickness in [m]
    • \(\epsilon_T\) is the dielectric permittivity under a constant stress in \([F/m]\)

We obtain \[ V_s = g_s F_s, \quad g_s = \frac{n d_{33}}{C} \]

Noise of a piezoelectric force sensor

As piezoelectric sensors have a capacitive source impedance, the sensor noise density \(N_{V_s}(\omega)\) is primarily due to current noise \(i_n\) reacting the capacitive source impedance: \[ N_{V_s}(\omega) = i_n \frac{1}{C \omega} \]

  • \(N_{V_s}\) is the measured noise in \(V/\sqrt{\text{Hz}}\)
  • \(i_n\) is the current noise in \(A/\sqrt{\text{Hz}}\)
  • \(C\) is the capacitance of the piezoelectric in \(F\)

The current noise density of a general purpose LM833 FET-input op-amp is \(0.5\ pA/\sqrt{\text{Hz}}\). The capacitance of a piezoelectric stack is typically between \(1 \mu F\) and \(100 \mu F\).

Bibliography

Fleming, A., Nanopositioning system with force feedback for high-performance tracking and vibration control, IEEE/ASME Transactions on Mechatronics, 15(3), 433447 (2010). http://dx.doi.org/10.1109/tmech.2009.2028422

  • [Actuators]({{< relref "actuators" >}})
  • [Force Sensors]({{< relref "force_sensors" >}})