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Thomas Dehaeze
2021-05-02 20:37:00 +02:00
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content/book/leach14_fundam_princ_engin_nanom.md
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@@ -8,7 +8,7 @@ Tags
: [Metrology]({{< relref "metrology" >}})
Reference
: ([Leach 2014](#orgc132434))
: ([Leach 2014](#org023e404))
Author(s)
: Leach, R.
@@ -87,6 +87,7 @@ The measurement of angles is then relative.
This type of angular interferometer is used to measure small angles (less than \\(10deg\\)).
## Bibliography {#bibliography}
<a id="orgc132434"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.
<a id="org023e404"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.