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Update all files with new citeproc-org package

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Thomas Dehaeze
2020-08-17 23:00:20 +02:00
parent 5cd67f9b6a
commit 590782ba60
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content/book/leach14_fundam_princ_engin_nanom.md
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@@ -8,7 +8,7 @@ Tags
: [Metrology]({{< relref "metrology" >}})
Reference
: ([Leach 2014](#orgc5df692))
: ([Leach 2014](#orgf8626f0))
Author(s)
: Leach, R.
@@ -89,4 +89,4 @@ This type of angular interferometer is used to measure small angles (less than \
## Bibliography {#bibliography}
<a id="orgc5df692"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.
<a id="orgf8626f0"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.