Update Content - 2021-05-30

This commit is contained in:
2021-05-30 19:15:14 +02:00
parent 772483b405
commit 4c096a392a
19 changed files with 848 additions and 863 deletions

View File

@@ -1,14 +1,15 @@
+++
title = "Fundamental principles of engineering nanometrology"
author = ["Thomas Dehaeze"]
draft = false
keywords = ["Metrology"]
draft = true
+++
Tags
: [Metrology]({{< relref "metrology" >}})
Reference
: ([Leach 2014](#orgdf2e918))
: ([Leach 2014](#org284df16))
Author(s)
: Leach, R.
@@ -90,4 +91,4 @@ This type of angular interferometer is used to measure small angles (less than \
## Bibliography {#bibliography}
<a id="orgdf2e918"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.
<a id="org284df16"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.