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Re-export all org mode files

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Thomas Dehaeze
2020-08-17 21:59:26 +02:00
parent bc8c757e21
commit 3816e389e9
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content/book/leach14_fundam_princ_engin_nanom.md
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@@ -8,7 +8,7 @@ Tags
: [Metrology]({{< relref "metrology" >}})
Reference
: <sup id="58bd6e601168ed1397ab2ec3cc3bab2d"><a href="#leach14_fundam_princ_engin_nanom" title="Richard Leach, Fundamental Principles of Engineering Nanometrology, Elsevier (2014).">(Richard Leach, 2014)</a></sup>
: ([Leach 2014](#orgc5df692))
Author(s)
: Leach, R.
@@ -86,5 +86,7 @@ The measurement of angles is then relative.
This type of angular interferometer is used to measure small angles (less than \\(10deg\\)).
# Bibliography
<a id="leach14_fundam_princ_engin_nanom"></a>Leach, R., *Fundamental principles of engineering nanometrology* (2014), : Elsevier. [↩](#58bd6e601168ed1397ab2ec3cc3bab2d)
## Bibliography {#bibliography}
<a id="orgc5df692"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.