Update Content - 2022-03-15

content/book/leach14_fundam_princ_engin_nanom.md

@@ -1,15 +1,15 @@
 +++
 title = "Fundamental principles of engineering nanometrology"
-author = ["Thomas Dehaeze"]
+author = ["Dehaeze Thomas"]
 keywords = ["Metrology"]
 draft = false
 +++
 
 Tags
-: [Metrology]({{<relref "metrology.md#" >}})
+: [Metrology]({{< relref "metrology.md" >}})
 
 Reference
-: ([Leach 2014](#org27b4df3))
+: (<a href="#citeproc_bib_item_1">Leach 2014</a>)
 
 Author(s)
 : Leach, R.
@@ -64,8 +64,8 @@ The second order nature means that cosine error quickly diminish as the alignmen
 ## Latest advances in displacement interferometry {#latest-advances-in-displacement-interferometry}
 
 Commercial interferometers
-=> fused silica optics housed in Invar mounts
-=> all the optical components are mounted to one central optic to reduce the susceptibility to thermal variations
+=&gt; fused silica optics housed in Invar mounts
+=&gt; all the optical components are mounted to one central optic to reduce the susceptibility to thermal variations
 
 One advantage that homodyme systems have over heterodyne systems is their ability to readily have the source fibre delivered to the interferometer.
 
@@ -88,7 +88,8 @@ The measurement of angles is then relative.
 This type of angular interferometer is used to measure small angles (less than \\(10deg\\)).
 
 
-
 ## Bibliography {#bibliography}
 
-<a id="org27b4df3"></a>Leach, Richard. 2014. _Fundamental Principles of Engineering Nanometrology_. Elsevier. <https://doi.org/10.1016/c2012-0-06010-3>.
+<style>.csl-entry{text-indent: -1.5em; margin-left: 1.5em;}</style><div class="csl-bib-body">
+  <div class="csl-entry"><a id="citeproc_bib_item_1"></a>Leach, Richard. 2014. <i>Fundamental Principles of Engineering Nanometrology</i>. Elsevier. doi:<a href="https://doi.org/10.1016/c2012-0-06010-3">10.1016/c2012-0-06010-3</a>.</div>
+</div>