Update Content - 2022-03-15

content/article/devasia07_survey_contr_issues_nanop.md

@@ -1,6 +1,6 @@
 +++
 title = "A survey of control issues in nanopositioning"
-author = ["Thomas Dehaeze"]
+author = ["Dehaeze Thomas"]
 draft = false
 +++
 
@@ -9,25 +9,26 @@ Tags
 
 
 Reference
-: ([Devasia, Eleftheriou, and Moheimani 2007](#orgfa66307))
+: (<a href="#citeproc_bib_item_1">Devasia, Eleftheriou, and Moheimani 2007</a>)
 
 Author(s)
-: Devasia, S., Eleftheriou, E., & Moheimani, S. R.
+: Devasia, S., Eleftheriou, E., &amp; Moheimani, S. R.
 
 Year
 : 2007
 
 -   Talks about Scanning Tunneling Microscope (STM) and Scanning Probe Microscope (SPM)
--   [Piezoelectric Actuators]({{< relref "piezoelectric_actuators" >}}): Creep, Hysteresis, Vibrations, Modeling errors
+-   [Piezoelectric Actuators]({{< relref "piezoelectric_actuators.md" >}}): Creep, Hysteresis, Vibrations, Modeling errors
 -   Interesting analysis about Bandwidth-Precision-Range tradeoffs
 -   Control approaches for piezoelectric actuators: feedforward, Feedback, Iterative, Sensorless controls
 
-<a id="orgd34b44a"></a>
-
-{{< figure src="/ox-hugo/devasia07_piezoelectric_tradeoff.png" caption="Figure 1: Tradeoffs between bandwidth, precision and range" >}}
+<a id="figure--fig:devasia07-piezoelectric-tradeoff"></a>
 
+{{< figure src="/ox-hugo/devasia07_piezoelectric_tradeoff.png" caption="<span class=\"figure-number\">Figure 1: </span>Tradeoffs between bandwidth, precision and range" >}}
 
 
 ## Bibliography {#bibliography}
 
-<a id="orgfa66307"></a>Devasia, Santosh, Evangelos Eleftheriou, and SO Reza Moheimani. 2007. “A Survey of Control Issues in Nanopositioning.” _IEEE Transactions on Control Systems Technology_ 15 (5). IEEE:802–23.
+<style>.csl-entry{text-indent: -1.5em; margin-left: 1.5em;}</style><div class="csl-bib-body">
+  <div class="csl-entry"><a id="citeproc_bib_item_1"></a>Devasia, Santosh, Evangelos Eleftheriou, and SO Reza Moheimani. 2007. “A Survey of Control Issues in Nanopositioning.” <i>Ieee Transactions on Control Systems Technology</i> 15 (5). IEEE: 802–23.</div>
+</div>