Update many files
PhDthesis were categorized as articles. Add "fron matter" to specify zettels category
This commit is contained in:
@@ -1,7 +1,7 @@
|
||||
+++
|
||||
title = "Control of wafer scanners: methods and developments"
|
||||
author = ["Thomas Dehaeze"]
|
||||
draft = false
|
||||
draft = true
|
||||
+++
|
||||
|
||||
Tags
|
||||
@@ -9,7 +9,7 @@ Tags
|
||||
|
||||
|
||||
Reference
|
||||
: ([Heertjes et al. 2020](#org38a977c))
|
||||
: ([Heertjes et al. 2020](#org3f3475f))
|
||||
|
||||
Author(s)
|
||||
: Heertjes, Marcel Fran\ccois, Butler, H., Dirkx, N., van der Meulen, S., Ahlawat, R., O'Brien, K., Simonelli, J., …
|
||||
@@ -20,4 +20,4 @@ Year
|
||||
|
||||
## Bibliography {#bibliography}
|
||||
|
||||
<a id="org38a977c"></a>Heertjes, Marcel François, Hans Butler, NJ Dirkx, SH van der Meulen, R Ahlawat, K O’Brien, J Simonelli, KT Teng, and Y Zhao. 2020. “Control of Wafer Scanners: Methods and Developments.” In _2020 American Control Conference (ACC)_, 3686–3703. IEEE.
|
||||
<a id="org3f3475f"></a>Heertjes, Marcel François, Hans Butler, NJ Dirkx, SH van der Meulen, R Ahlawat, K O’Brien, J Simonelli, KT Teng, and Y Zhao. 2020. “Control of Wafer Scanners: Methods and Developments.” In _2020 American Control Conference (ACC)_, 3686–3703. IEEE.
|
||||
|
Reference in New Issue
Block a user