This commit is contained in:
@@ -0,0 +1,46 @@
|
||||
+++
|
||||
title = "An instrument for 3d x-ray nano-imaging"
|
||||
author = ["Dehaeze Thomas"]
|
||||
draft = false
|
||||
+++
|
||||
|
||||
Tags
|
||||
: [Nano Active Stabilization System]({{< relref "nano_active_stabilization_system.md" >}}), [Positioning Stations]({{< relref "positioning_stations.md" >}})
|
||||
|
||||
Reference
|
||||
: (<a href="#citeproc_bib_item_1">Holler et al. 2012</a>)
|
||||
|
||||
Author(s)
|
||||
: Holler, M., Raabe, J., Diaz, A., Guizar-Sicairos, M., Quitmann, C., Menzel, A., & Bunk, O.
|
||||
|
||||
Year
|
||||
: 2012
|
||||
|
||||
Instrument similar to the NASS.
|
||||
Obtain position stability of 10nm (standard deviation).
|
||||
|
||||
<a id="figure--fig:holler12-station"></a>
|
||||
|
||||
{{< figure src="/ox-hugo/holler12_station.png" caption="<span class='figure-number'>Figure 1: </span>Schematic of the tomography setup" >}}
|
||||
|
||||
- **Limited resolution due to instrumentation**:
|
||||
The resolution of ptychographic tomography remains above 100nm due to instabilities and drifts of the scanning systems.
|
||||
- **Need of a Metrology System**:
|
||||
|
||||
> To achieve positioning accuracy and stability in the nanometer range, one cannot rely on the position encoders built into individual positioning stages.
|
||||
> A precise exteroceptive measurement of the relative position of the optical elements with respect to the sample is mandatory.
|
||||
> Thus, thermal drifts and parasitic motions can be measured and compensated for.
|
||||
- **Interferometer System Concept**:
|
||||
The sample is aligned with the X-ray with the XYZ piezo stage.
|
||||
As a result, the metrology sphere will be usually off center with respect to the rotation axis of the spindle.
|
||||
That implies that the laser will not propagate back to the interferometer at all rotation angles.
|
||||
A position sensitive detector (PSD) is used, it provides a measurement of the position of the sphere in the plane perpendicular to the laser.
|
||||
The interferometer is positionned on top of a translation stage. The PSD information is used to close the loop so that the interferometer follows the displacement of the metrology sphere.
|
||||
- **Feedback Loop**: Using the signals from the 2 interferometers, the loop is closed to compensate low frequency vibrations and thermal drifts.
|
||||
|
||||
|
||||
## Bibliography {#bibliography}
|
||||
|
||||
<style>.csl-entry{text-indent: -1.5em; margin-left: 1.5em;}</style><div class="csl-bib-body">
|
||||
<div class="csl-entry"><a id="citeproc_bib_item_1"></a>Holler, M., J. Raabe, A. Diaz, M. Guizar-Sicairos, C. Quitmann, A. Menzel, and O. Bunk. 2012. “An Instrument for 3d X-Ray Nano-Imaging.” <i>Review of Scientific Instruments</i> 83 (7): 073703. doi:<a href="https://doi.org/10.1063/1.4737624">10.1063/1.4737624</a>.</div>
|
||||
</div>
|
||||
Reference in New Issue
Block a user