Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution
Contents
- Tags
- Nano Active Stabilization System
- Reference
- (Jun Wang {\it et al.}, 2012)
- Author(s)
- Wang, J., Chen, Y. K., Yuan, Q., Tkachuk, A., Erdonmez, C., Hornberger, B., & Feser, M.
- Year
- 2012
Introduction of Markers: That limits the type of samples that is studied
There is a need for markerless nano-tomography => the key requirement is the precision and stability of the positioning stages.
Passive rotational run-out error system: It uses calibrated metrology disc and capacitive sensors
Bibliography
Wang, J., Chen, Y. K., Yuan, Q., Tkachuk, A., Erdonmez, C., Hornberger, B., & Feser, M., Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution, Applied Physics Letters, 100(14), 143107 (2012). http://dx.doi.org/10.1063/1.3701579 ↩