+++
title = "Interferometric characterization of rotation stages for x-ray nanotomography"
author = ["Thomas Dehaeze"]
draft = false
+++

Tags
: [Nano Active Stabilization System]({{< relref "nano_active_stabilization_system" >}}), [Positioning Stations]({{< relref "positioning_stations" >}})

Reference
: ([Stankevic et al. 2017](#org5a36a6f))

Author(s)
: Stankevic, T., Engblom, C., Langlois, F., Alves, F., Lestrade, A., Jobert, N., Cauchon, G., …

Year
: 2017

-   Similar Station than the NASS
-   Similar Metrology with fiber based interferometers and cylindrical reference mirror

<a id="orgbfe970a"></a>

{{< figure src="/ox-hugo/stankevic17_station.png" caption="Figure 1: Positioning Station" >}}

-   **Thermal expansion**: Stabilized down to \\(5mK/h\\) using passive water flow through the baseplate below the sample stage and in the interferometry reference frame.
-   **Controller**: Two Independant PID loops
-   Repeatable errors => feedforward (Look Up Table)
-   Non-repeatable errors => feedback
-   Result: 40nm runout error


## Bibliography {#bibliography}

<a id="org5a36a6f"></a>Stankevic, Tomas, Christer Engblom, Florent Langlois, Filipe Alves, Alain Lestrade, Nicolas Jobert, Gilles Cauchon, Ulrich Vogt, and Stefan Kubsky. 2017. “Interferometric Characterization of Rotation Stages for X-Ray Nanotomography.” _Review of Scientific Instruments_ 88 (5):053703. <https://doi.org/10.1063/1.4983405>.
