# Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution - My digital brain
Tags Nano Active Stabilization System Reference (Jun Wang {\it et al.}, 2012) Author(s) Wang, J., Chen, Y. K., Yuan, Q., Tkachuk, A., Erdonmez, C., Hornberger, B., &amp; Feser, M. Year 2012 Introduction of Markers: That limits the type of samples that is studied There is a need for markerless nano-tomography =&gt; the key requirement is the precision and stability of the positioning stages. Passive rotational run-out error system: It uses calibrated metrology disc and capacitive sensors
Author: — Thomas Dehaeze

# Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution

Tags
  Nano Active Stabilization System
Reference
  (Jun Wang {\it et al.}, 2012)
Author(s)
  Wang, J., Chen, Y. K., Yuan, Q., Tkachuk, A., Erdonmez, C., Hornberger, B., & Feser, M.
Year
  2012

Introduction of Markers: That limits the type of samples that is studied

There is a need for markerless nano-tomography => the key requirement is the precision and stability of the positioning stages.

Passive rotational run-out error system: It uses calibrated metrology disc and capacitive sensors

# Bibliography

Wang, J., Chen, Y. K., Yuan, Q., Tkachuk, A., Erdonmez, C., Hornberger, B., & Feser, M., Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution, Applied Physics Letters, 100(14), 143107 (2012). http://dx.doi.org/10.1063/1.3701579 ↩